SCL-Sensor.Tech. Fabrication focuses on the improvement of next generation atomic force microscopy (AFM) cantilevers. Two types of this next generation AFM sensor probes are especially small & soft cantilevers for low noise and highly sensitive SPM imaging as well as piezoresistive self-sensing cantilevers for new AFM applications. These cantilevers are suited for use in tapping and contact AFM imaging mode. With self-sensing probes no laser is necessary and the space above the cantilever is freed up e.g. for use within a SEM (AFSEM: http://www.getec-afm.com/index.php?id=4 and https://www.nanosurf.com/en/products/afsem-afm-for-sem).
Fast progress in nanoscience and nanotechnology give rise to new business opportunities and needs. As AFM/SPM technology develops and new applications are created, conventional cantilevers are often not ideal or even not usable at all. For most users however, developing the technology to make their own cantilevers is not feasible or practical. SCL-Sensor.Tech. gives researchers the opportunity to implement their AFM cantilever ideas even in small batch fabrications.
We have developed a set of technology tools that can be used to fabricate custom cantilevers, without extensive lead time. Together with the customer, we can develop cantilever solutions for specific applications such as high speed AFM, high resolution force spectroscopy, gas sensing, torque magnetometry and many others.
Because of the advantages of small and self-sensing cantilevers for many AFM applications, we have developed technology to make such cantilevers commercially available. These cantilevers are only a few micrometers in length and width and are electrically actuated and sensed/readout. They have integrated tips (silicon or diamond), are fabricated without tip (tip-less) and are intended for high resolution and high speed AFM applications.