SCL-Sensor.Tech. focuses on development of next generation Atomic Force Microscopy (AFM) cantilevers. The fast developments in nanoscience and nanotechnology give rise to new business opportunities and needs. Many new technologies are yet too experimental to warrant large scale commercial realization. As AFM technology develops and new applications are created, conventional cantilevers are often not ideal or even not usable at all. For most users however, developing the technology to make their own cantilevers is not feasible or practical. SCL-Sensor.Tech. gives researchers the opportunity to implement their AFM cantilever ideas even in small batches.
We have developed a set of technology tools that can be used to fabricate custom cantilevers, without extensive lead time. Together with the customer, we can develop cantilever solutions for specific applications such as high speed AFM, high resolution force spectroscopy, active cantilever readout and many others.
Because of the advantages of small cantilevers for many AFM applications, demonstrated by many research groups, we have developed technology to make such cantilevers commercially available. These cantilevers are only a few micrometers wide and on the order of 100 nm thick. They have integrated tips, are coated with a high reflectivity coating and are intended for high resolution force spectroscopy and high speed AFM applications.